Texas Instruments Incorporated, a worldwide leader in radio frequency identification (RFID) technology, and Moore Wallace, an RR Donnelley company, today announced a multi-year strategic agreement to offer Electronic Product Code (EPC) Generation 2 (Gen 2) smart label solutions. Under the terms of the agreement, TI will be a primary supplier of ultra-high frequency (UHF) EPC Gen 2 tag technology to Moore Wallace, which will provide EPC Gen 2 finished labels to the consumer products goods (CPGs), manufacturing and pharmaceutical companies who are implementing RFID for supply chain applications.
The newest and most advanced of the EPCglobal Inc specifications for the UHF band in the 900 MHz range, EPC Gen 2 provides enhanced features and improved performance including global interoperability, superior tag throughput, multiple read/write capability, enhanced security, and the ability to operate in dense reader environments. Moore Wallace, which is among the largest label converters in North America, will support the manufacture of 500+ million EPC labels annually in multiple facilities. Samples of the EPC Gen 2 labels from Moore Wallace with TI EPC Gen 2 inlays are available now, with full production planned for later in Q3 2005.
TIs ability to design and manufacture the highest quality RFID tags in large volumes that meet our demanding reliability and ease-of-integration requirements while optimising our processes, makes them an ideal partner as we produce finished EPC Generation 2 labels for our customers, said Greg Santini, senior vice president of label operations at Moore Wallace.
A strategic label converter customer over the last seven years, our collaboration with Moore Wallace has advanced the market for RFID smart labels in a diverse number of applications. With top CPG suppliers looking to implement EPC Gen 2 technology in their retail supply chains, Moore Wallace continues to make significant investments in RFID and we look forward to a fruitful alliance in serving these new customers, said Julie England, vice president of Texas Instruments and general manager for Texas Instruments RFid Systems.